Characterization of a thickness-shear mode quartz resonator with multiple nonpiezoelectric layers

Journal Article · Tue Feb 01 00:00:00 EST 1994 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.356410· OSTI ID:5337826

Granstaff, V E; Martin, S J ^[1]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

This paper describes a one-dimensional analysis of a piezoelectric resonator with multiple nonpiezoelectric layers of arbitrary thickness and complex shear modulus. This analysis shows under what conditions the simple Butterworth--Van Dyke (BVD) lumped-element equivalent circuit can be used to extract the properties of these layers, and provides a theoretical basis for doing so under these conditions. The method presented here is based on the physics of wave propagation, but uses transmission line techniques to transform the equations and boundary conditions into a simple string of 2[times]2 matrix multiplications, which easily accommodate any number of layers. An analysis of the AT-cut quartz/polymer/liquid composite resonator is presented in detail because of its importance in sensor and electrochemical quartz crystal microbalance applications. The analysis shows that adding the polymer and liquid impedances in the motional arm of a BVD circuit is [ital not] valid near the polymer film resonance, but is appropriate for a thin, rigid polymer film in contact with a liquid.

• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5337826
• Journal Information: Journal of Applied Physics; (United States), Vol. 75:3; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
QUARTZ
RESONATORS
SHEAR
EQUIVALENT CIRCUITS
LAYERS
LIQUIDS
PIEZOELECTRICITY
POLYMERS
THICKNESS
WAVE PROPAGATION
DIMENSIONS
ELECTRICITY
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FLUIDS
MINERALS
OXIDE MINERALS
665000* - Physics of Condensed Matter- (1992-)