Miniature acousto-optic image correlator

Conference · Sun Jul 21 04:00:00 EDT 1991 · Proceedings of SPIE - The International Society for Optical Engineering

DOI:https://doi.org/10.1117/12.49745· OSTI ID:5320817

Molley, Perry A. ^[1]; Sweatt, William C. ^[1]; Strong, David Scott ^[1]

---

1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

An acousto-optic (AO) image correlator architecture will be presented that minimizes the overall system size while maintaining excellent image quality for large input scenes. The correlator can accommodate gray-scale input scenes with dimensions of 512 X 244 pixels and gray-scale reference templates of 64 X 64 pixels. The size of the optical system, however, is less than 10 cubic inches, 1" X 1" X 9". This design incorporates a surface emitting laser diode array that has a center-to-center spacing of the laser elements matched to the row spacing on the CCD. Furthermore, the space-bandwidth and center frequency of the AO cell are chosen to match the length of the input image information in the cell to the width of the CCD. These two design decisions allow close to one-to-one imaging through the entire optical system producing the shortest possible path length. The optics were then designed with a goal of producing nearly diffraction-limited image quality.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5320817
• Report Number(s): SAND--90-3161C; CONF-9107115--44; ON: DE91018002
• Conference Information: Journal Name: Proceedings of SPIE - The International Society for Optical Engineering Journal Volume: 1564
• Country of Publication: United States
• Language: English

Related Subjects

440600* -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ACOUSTIC DETECTION
ACOUSTIC MEASUREMENTS
CHARGE-COUPLED DEVICES
CHARGED PARTICLE DETECTION
CORRELATIONS
DESIGN
DETECTION
IMAGE PROCESSING
LENSES
LIGHT EMITTING DIODES
OPTICAL SYSTEMS
PATTERN RECOGNITION
PROCESSING
RADIATION DETECTION
RESOLUTION
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SIZE
SPATIAL RESOLUTION