Off-axis reflection zone plate for quantitative soft x-ray source characterization

Journal Article · Tue Jul 01 00:00:00 EDT 1997 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.119497· OSTI ID:531720

Wilhein, T; Hambach, D; Niemann, B ^[1]; Berglund, M; Rymell, L; Hertz, H M ^[2]

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1. Forschungseinrichtung Roentgenphysik, Georg-August Universitaet Goettingen, D-37073 Goettingen (Germany)
2. Department of Physics, Lund Institute of Technology, S-221 00 Lund (Sweden)

A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate {lambda}/{Delta}{lambda}{ge}1000 spectral resolution and absolute flux and brilliance measurements. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 531720
• Journal Information: Applied Physics Letters, Vol. 71, Issue 2; Other Information: PBD: Jul 1997
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
X-RAY SPECTROSCOPY
X-RAY SOURCES
CHARGE-COUPLED DEVICES
CALIBRATION
SOFT X RADIATION
PULSES
BEAM OPTICS
GRAZING
LASER-PRODUCED PLASMA
DIFFRACTION GRATINGS