Ultra-precision grinding of chemically vapor deposited silicon carbide mirrors for synchrotron radiation
Book
·
OSTI ID:531536
- Chubu Univ., Kasugai, Aichi (Japan). Dept. of Mechanical Engineering
Chemically vapor deposited silicon carbide (CVD-SiC) is the most important material of mirrors for high-brightness synchrotron radiation beamlines, though the material is too difficult to be machined. It takes quite a long time to polish SiC substrate to make mirrors. This paper intends to reduce the machining time to make CVD-SiC mirrors by using ultra-precision grinding technology. The CVD-SiC sample has been ground into 0.4nm rms in surface roughness by a resinoid-bonded diamond wheel and an ultra-precision surface grinder having a glass-ceramic spindle of extremely-low thermal expansion. The surface roughness of ground samples were measured with TOPO-3D and AFM. 88.7% reflectivity has been obtained on the ground CVD-SiC flat surface, measured with X-ray of 0.834 nm in wavelength at the grazing incident angle of 0.7--0.95 degree. The reflectivity depends upon the angle between the direction of incident beam and grinding marks on the sample. The relationship between the surface roughness and grinding conditions was also discussed.
- OSTI ID:
- 531536
- Report Number(s):
- CONF-960848--; ISBN 0-8194-2244-4
- Country of Publication:
- United States
- Language:
- English
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