Monolithic silicon x-ray interferometer with varying mirror-analyzer spacing for the analysis of beam coherence
Conference
·
OSTI ID:531533
- Univ. of Tokyo (Japan)
A Laue-Laue-Laue x-ray interferometer with the inclined third crystal plate was fabricated to demonstrate wavefront-dividing interferometry in x-ray region. Observed interference patterns showed the effects of spatial coherence of the incident wave, in addition to the incident angle dependent spatial fringes expected from the dynamical theory of diffraction. From the visibility of the interference pattern, the source size used was estimated using Van Cittert-Zernike theorem.
- OSTI ID:
- 531533
- Report Number(s):
- CONF-960848--; ISBN 0-8194-2244-4
- Country of Publication:
- United States
- Language:
- English
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