Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

R and D program on bimorph mirrors at the ESRF

Conference ·
OSTI ID:531524
; ;  [1]
  1. European Synchrotron Radiation Facility, Grenoble (France)

The very low emittance of new synchrotron sources and the increasing number of micro-focusing applications make the production of highly stable and well defined beams increasingly necessary. The use of flexible mirrors whose curvature can be changed while maintaining a correct figure appeared to be a very attractive solution. For over two years, the ESRF has been developing a new approach which consists of making an X-ray mirror from an active material such as piezoelectric ceramics. With respect to conventional bender this concept, already used in astronomical and laser applications, has the advantages to be mechanics free, very compact and relatively cost effective. This paper presents the status of the ESRFs developments in this field. First, theoretical and technical descriptions of the system are given. Experimental tests of various configurations confirmed the potential of this concept. For example, two 150mm long bimorph mirrors set into a Kirkpatrick-Baez geometry gave a focused spot of 10{micro}m (vertical) x 20{micro}m (horizontal). Finally, the developments of in-situ control systems (strain gauges, optical devices), necessary to fully exploit the capabilities of these active optics, are discussed.

OSTI ID:
531524
Report Number(s):
CONF-960848--; ISBN 0-8194-2244-4
Country of Publication:
United States
Language:
English

Similar Records

Stitching methods at the European Synchrotron Radiation Facility (ESRF)
Journal Article · Sun May 15 00:00:00 EDT 2016 · Review of Scientific Instruments · OSTI ID:22597929

Modular Bimorph Mirrors: From an Established Hardware Design to First Experimental Results Towards Wavefront Correction in the X-ray Domain
Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings · OSTI ID:20653076

Status of the optical metrology at the ESRF
Conference · Mon Dec 30 23:00:00 EST 1996 · OSTI ID:531535