Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Overview of pulsers for nanosecond gating of image-shutter tubes

Conference ·
OSTI ID:5313431
The capability of generating a useful optical shutter of a few nanoseconds or less utilizing gated proximity-focussed microchannel-plate (MCP) wafer tubes or silicon intensified target (SIT) vidicon tubes depends strongly on the driving electrical pulse. This paper will provide a summary of some of the electrical gate pulsers utilized in studying both proximity-focussed MCP imaging intensifiers and gated SIT FPS vidicon tubes. (WHK)
Research Organization:
Los Alamos National Lab., NM (USA)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
5313431
Report Number(s):
LA-UR-82-2159; CONF-820822-3; ON: DE82019533
Country of Publication:
United States
Language:
English