Inverse of the photoelectric effect in Al
Journal Article
·
· Phys. Rev. Lett.; (United States)
Theoretical predictions for inverse photoemission from free-electron-like materials are tested by measurement of the energy and angle dependence of the emitted photon intensity from Al. The predicted cross-section minimum at the plasma frequency ..omega../sub p/ is observed as well as a characteristic increase below ..omega../sub p/ due to the inverse of the surface photoelectric effect. Above ..omega../sub p/ there is an additional bulklike contribution from the radiative decay of bulk plasmons. Other materials with a well-defined plasma resonance, e.g., Ge and Si, exhibit a similar cross-section behavior
- Research Organization:
- IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598
- OSTI ID:
- 5313374
- Journal Information:
- Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 60:20; ISSN PRLTA
- Country of Publication:
- United States
- Language:
- English
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