Thermal expansivity of Nb/sub 3/Ge. [Nb/sub 3/Sn]

Journal Article · Mon Oct 31 23:00:00 EST 1977 · J. Low Temp. Phys.; (United States)

DOI:https://doi.org/10.1007/BF00655096· OSTI ID:5313231

Hull, G W; Newkirk, L R

X-ray powder diffraction studies as a function of temperature from 4.2 to approx.675 K were performed on a Nb/sub 3/GE sample (T/sub c/=21.09 K) prepared by chemical vapor deposition. The cell constant varied linearly with temperature in the range approx.150 to approx.675 K and the expansion coefficient was computed to be 6.98 x 10/sup -6//K. A similar study to room temperature for sintered Nb/sub 3/Sn indicated an expansion coefficient similar to that of Nb/sub 3/Ge. No evidence was found for the occurrence of a phase change in Nb/sub 3/Ge over the temperature range studied.

• Research Organization: Bell Laboratories, Murray Hill, New Jersey
• OSTI ID: 5313231
• Journal Information: J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 29:3; ISSN JLTPA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
ALLOYS
COHERENT SCATTERING
DIFFRACTION
EXPANSION
GERMANIUM ALLOYS
HIGH TEMPERATURE
LATTICE PARAMETERS
LOW TEMPERATURE
MEDIUM TEMPERATURE
NIOBIUM ALLOYS
NIOBIUM BASE ALLOYS
SCATTERING
TEMPERATURE DEPENDENCE
THERMAL EXPANSION
TIN ALLOYS
ULTRALOW TEMPERATURE
VERY LOW TEMPERATURE
X-RAY DIFFRACTION