Electrostatic plugging of leaks in a multidipole device

Journal Article · Tue Jun 01 04:00:00 EDT 1982 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.331277· OSTI ID:5310914

Hershkowitz, N; Hendricks, K; Carpenter, R T

Electrostatic plugging is used to improve plasma confinement in a multidipole ion source. A conventional multidipole device is modified by placing positively biased electrodes on both sides of each magnetic line cusp. As the electrode bias voltage is increased from zero, plasma density increases by approximately a factor of 2 and the plasma potential follows the electrode potential. The density enhancement is reduced as neutral pressure is increased or if the electrode-gap width is decreased. Similar behavior is observed when a negatively biased grid is present. A model which assumes that the main electron-loss mechanism at high electrode bias is diffusion across the cusp magnetic field lines is shown to be in qualitative agreement with measurements.

• Research Organization: Department of Physics and Astronomy, The University of Iowa, Iowa City, Iowa 52240
• DOE Contract Number: AC02-76ET53034
• OSTI ID: 5310914
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 53:6; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430301* -- Particle Accelerators-- Ion Sources
CLOSED CONFIGURATIONS
CONFINEMENT
CUSPED GEOMETRIES
DIFFUSION
DIPOLES
ELECTRIC POTENTIAL
ELECTRODES
ELECTRONS
ELECTROSTATICS
ELEMENTARY PARTICLES
FERMIONS
ION SOURCES
LEPTONS
MAGNETIC FIELD CONFIGURATIONS
MAGNETIC FIELDS
MULTIPOLAR CONFIGURATIONS
MULTIPOLES
OPEN CONFIGURATIONS
PLASMA CONFINEMENT
PLASMA DENSITY