Reliability considerations of electronics components for the deep underwater muon and neutrino detection system

Conference · Thu Jan 31 23:00:00 EST 1980

OSTI ID:5310760

Leskovar, B

The reliability of some electronics components for the Deep Underwater Muon and Neutrino Detection (DUMAND) System is discussed. An introductory overview of engineering concepts and technique for reliability assessment is given. Component reliability is discussed in the contest of major factors causing failures, particularly with respect to physical and chemical causes, process technology and testing, and screening procedures. Failure rates are presented for discrete devices and for integrated circuits as well as for basic electronics components. Furthermore, the military reliability specifications and standards for semiconductor devices are reviewed.

• Research Organization: California Univ., Berkeley (USA). Lawrence Berkeley Lab.
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5310760
• Report Number(s): LBL-10548; CONF-800240-1
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLE DETECTION
DETECTION
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
LEVELS
MEASURING INSTRUMENTS
MUON DETECTION
NEUTRINO DETECTION
RADIATION DETECTION
RADIATION DETECTORS
RELIABILITY
UNDERWATER