Influence of PF/sub 6/ dopant concentration on the x-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy spectra of poly 3-methylthiophene

Journal Article · Sun May 01 00:00:00 EDT 1988 · J. Vac. Sci. Technol., A; (United States)

DOI:https://doi.org/10.1116/1.575038· OSTI ID:5310132

Nelson, A J; Glenis, S; Frank, A J

X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy techniques have been used to characterize electrochemically grown conductive films of poly (3-methylthiophene) in the PF/sub 6/ doped and undoped states. The PF/sub 6/ dopant concentration was varied between the undoped and fully doped states. Core-level and valence-level spectra have yielded information on the nature of the polymeric cation and its associated PF/sub 6/ anion, as well as structural disorder effects in these polymers. Results have revealed that addition of the PF/sub 6/ counterion causes structural disorder within the polymer and that the PF/sub 6/ counterion interacts with the highest occupied nonbonding lone-pair orbital, as well as causing shifts in the photoelectric threshold which may indicate the formation of bipolaron bands.

• Research Organization: Solar Energy Research Institute, Golden, Colorado 80401
• OSTI ID: 5310132
• Journal Information: J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 6:3; ISSN JVTAD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
360604 -- Materials-- Corrosion
Erosion
& Degradation
CRYSTAL DOPING
CRYSTAL STRUCTURE
DATA
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRONIC STRUCTURE
ENERGY LEVELS
EXPERIMENTAL DATA
HETEROCYCLIC COMPOUNDS
INFORMATION
NUMERICAL DATA
ORGANIC COMPOUNDS
ORGANIC SULFUR COMPOUNDS
PHOTOELECTRIC EFFECT
PHOTOELECTROMAGNETIC EFFECTS
PHYSICAL PROPERTIES
POLYMERS
THIOPHENE