Signal and white noise properties of edge junction dc SQUID's

Journal Article · Mon Apr 04 04:00:00 EDT 1988 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.99197· OSTI ID:5307236

Wakai, R T; Van Harlingen, D J

We have fabricated and characterized the noise performance of submicron edge junction dc superconducting quantum interference devices (SQUID's) which exhibit excellent signal properties and extremely high flux sensitivity. At frequencies above about 3 MHz, the SQUID noise is white and is in reasonable agreement with computer simulations for a thermal noise-limited detector. In one device the measured flux energy resolution is 1.6 +- 0.5(h/2..pi..) at 1.5 K, within a factor of 2 of the quantum-limited value suggested by theoretical modeling.

• Research Organization: Department of Physics and Materials Research Laboratory, University of Illinois at Urbana--Champaign, Urbana, Illinois 61801
• OSTI ID: 5307236
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 52:14; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COMPUTERIZED SIMULATION
DATA
ELECTRONIC EQUIPMENT
EQUIPMENT
EXPERIMENTAL DATA
FABRICATION
FLUXMETERS
INFORMATION
MEASURING INSTRUMENTS
MICROWAVE EQUIPMENT
NOISE
NUMERICAL DATA
RESOLUTION
SENSITIVITY
SIMULATION
SQUID DEVICES
SUPERCONDUCTING DEVICES