The microstructural characterization of an in situ grown Si{sub 3}N{sub 4} whisker-reinforced BAS glass-ceramic matrix composite
- Univ. of Houston, TX (United States)
The microstructure of barium aluminum silicate (BAS)/silicon nitride in situ whisker reinforced ceramic matrix composite was examined by X-ray diffraction, transmission electron microscopy, electron diffraction and energy-dispersive X-ray microanalysis. Although the authors can not conclusively exclude the presence of orthorhombic BAS, hexagonal BAS and both {alpha}-Si{sub 3}N{sub 4} and {beta}-Si{sub 3}N{sub 4} were identified in this material. The {beta}-Si{sub 3}N{sub 4} whiskers nucleate and grow in random directions in the nearly continuous matrix of metastable hexacelsian. The crystallization process of the glass phase can be taken almost to completion but a small proportion of residual glass phase is present at the interface and grains-junction. Both whisker-like and equiaxed {beta}-Si{sub 3}N{sub 4} exist in this material.
- OSTI ID:
- 530683
- Report Number(s):
- CONF-9604124-; CNN: Grant 003652123-ATP; TRN: 97:003389-0019
- Resource Relation:
- Conference: 98. annual meeting of the American Ceramic Society, Indianapolis, IN (United States), 14-17 Apr 1996; Other Information: PBD: 1996; Related Information: Is Part Of Ceramic transactions: Advances in ceramic-matrix composites III. Volume 74; Bansal, N.P.; Singh, J.P. [eds.]; PB: 667 p.
- Country of Publication:
- United States
- Language:
- English
Similar Records
In situ whisker-reinforced AlPO{sub 4}-modified {beta}-eucryptite glass-ceramic. 1: Morphology and crystallization kinetics
Processing and properties of SiC whisker reinforced Si sub 3 N sub 4 ceramic matrix composites