Simple method to evaluate coupling functions at antireflection-coated diode facets facing grating reflectors of long external cavities

Journal Article · Fri Oct 01 04:00:00 EDT 1993 · IEEE Photonics Technology Letters (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/68.248418· OSTI ID:5301535

Chen, Jianguo; Li, Binzhong; Wu, Lan; Li, Dayi; Lu, Yucun ^[1]

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1. Sichuan Univ., Chengdu (China). Dept. of Optoelectronics

The spectral content of the reflected light from a grating, positioned at a distance much longer than the diode length to form an external-cavity semiconductor laser, has been studied. The analytical expression derived show that the coupling coefficient at the antireflection (AR)-coated diode facet facing the extended cavity can be divided into two factors, of which one is due to the off-overlapping between the centers of the diode mode and its reflected counterpart, and the other is due to the alteration of the wave vector after being dispersed by the grating.

• OSTI ID: 5301535
• Journal Information: IEEE Photonics Technology Letters (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Photonics Technology Letters (Institute of Electrical and Electronics Engineers); (United States) Vol. 5:10; ISSN 1041-1135; ISSN IPTLEL
• Country of Publication: United States
• Language: English

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