Satellite observations and instrumentation for measuring energetic neutral atoms
- Lockheed Palo Alto Research Lab., CA (United States). Space Sciences Lab.
Direct measurements of energetic neutral atoms (ENA) and ions have been obtained with the cooled solid state detectors on the low-altitude (220 km) three-axis stabilized S81-1/ stimulated emissions of energetic particles (SEEP) satellite and on the spinning 400 km [times] 5.5 R[sub e] (where R[sub e] is Earth radii) Combined Release and Radiation Effects Satellite (CRRES). During magnetic storms ENA and ion precipitation (E > 10 keV) are evident over the low-altitude equatorial region based on data from the SEEP (ONR 804) spectrometers and CRRES ion mass spectrometer (IMS-HI) (ONR 307-8-3) ion composition and ENA instrument. The IMS-HI neutral atom spectrometer covers the energy range from 20 to 1,500 keV with a geometrical factor of 10[sub [minus]3] cm[sup 2] sr and uses a 7-kG magnetic field to screen out protons less than about 50 MeV. During the strong magnetic storm of 24 March 1991 the first ENA and ion mass composition measurements were obtained of ring current particles below the inner belt and these fluxes are compared to the IMS-HI flux measurements in the ring current. Recently, an advanced spectrometer, the Source/Loss-cone Energetic Particle Spectrometer (SEPS), has been developed to image electrons, ions, and neutrals on the despun platform of the POLAR satellite ([approximately]1.8 [times] 9 R[sub e]) for launch in the mid 1990s as part of NASA's International Solar Terrestrial Physics/Global Geospace Science (ISTP/GGS) program.
- OSTI ID:
- 5289028
- Journal Information:
- Optical Engineering; (United States), Journal Name: Optical Engineering; (United States) Vol. 32:12; ISSN 0091-3286; ISSN OPEGAR
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
Ionospheric
& Magnetospheric Phenomena-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CURRENTS
EARTH ATMOSPHERE
EARTH MAGNETOSPHERE
ELECTRIC CURRENTS
IONIC COMPOSITION
MEASURING INSTRUMENTS
POSITION SENSITIVE DETECTORS
RADIATION DETECTORS
REMOTE SENSING
RING CURRENTS
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS