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Extended x-ray-absorption fine-structure studies of electron-lattice correlations in mixed-valence Sm/sub 0. 75/Y/sub 0. 25/S

Journal Article · · Phys. Rev. Lett.; (United States)
X-ray absorption spectrum of the Sm L/sub III/ edge has been measured in mixed-valence Sm/sub 0.75/Y/sub 0.25/S. From analysis of the edge structure and extended x-ray absorption fine structure, the valence is determined and it is shown that the S neighbors of each Sm atom adopt an average distance rather than a dynamically distorted environment with two distances corresponding to the two valence states. From this it is concluded that the characteristic Sm 4f-band width is not greatly modified by polaron effects.
Research Organization:
Xerox Palo Alto Research Center, Palo Alto, California 94304
OSTI ID:
5280701
Journal Information:
Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 44:19; ISSN PRLTA
Country of Publication:
United States
Language:
English