Cross section for photodetachment of the excited C{sup {minus}}({sup 2}D) ion using fast ion-laser-beam electron spectroscopy
- Department of Physics, University of Tennessee, Knoxville, Tennessee 37996 (United States)
- Department of Physics, Goeteborg University and Chalmers University of Technology, S-412 96 Goeteborg (Sweden)
A crossed-beam apparatus incorporating photoelectron spectroscopy has been used to determine the partial cross section for photodetaching an electron from the excited C{sup {minus}}({sup 2}D) ion via the {sup 3}Pks,d channels. The measurement, which was based on the saturation of the photodetachment process, was normalized to that of D{sup {minus}} taken under the same experimental conditions. At a photon energy of 2.076 eV, the cross section was found to be 13(2) Mb. Simultaneously, the beam fraction in the excited state in the incoming C{sup {minus}} ion beam was found to be 0.5(1). {copyright} {ital 1997} {ital The American Physical Society}
- OSTI ID:
- 528046
- Journal Information:
- Physical Review A, Journal Name: Physical Review A Journal Issue: 2 Vol. 56; ISSN 1050-2947; ISSN PLRAAN
- Country of Publication:
- United States
- Language:
- English
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