Multiple energy x-ray holography: Incident-radiation polarization effects
- Physics Department, University of California, Davis, California 95616 (United States)
- Oak Ridge National Laboratory at the National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
- Hamburger Synchrotronstrahlungslabor HASYLAB am Deutsches Elektronen-Synchrotron DESY, 22603 Hamburg (Germany)
Multiple energy x-ray holography (MEXH) measures both phase and amplitude information for x rays scattered from an incident reference beam, from which three-dimensional atomic images can be directly reconstructed. The angular distribution of the x-ray scattering is highly dependent on the polarization direction via the Thomson scattering cross section. We consider here the effect of incident x-ray polarization on images of Fe atoms reconstructed from theoretical and experimental MEXH data for {alpha}-Fe{sub 2}O{sub 3}(001) (hematite). We also illustrate such polarization effects theoretically in the enhancement of specific atomic structural information of ideal Fe trimers, and a Ge {delta}-layer buried in Si(001), where the use of different polarization modes and experimental geometries is found to strongly influence atomic images. {copyright} {ital 1997} {ital The American Physical Society}
- Research Organization:
- Lawrence Berkeley National Laboratory
- DOE Contract Number:
- AC03-76SF00098; AC05-84OR21400
- OSTI ID:
- 527002
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 3 Vol. 56; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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