Can atomic force microscopy tips be inspected by atomic force microscopy
Journal Article
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
- Univ. of Leuven (Belgium)
This paper reports on an attempt to image prospective tips by atomic force microscopy. The apex of mounted diamond fragments and of traditional metallic tips was investigated by the same diamond probe. The peculiar tip-tip configuration allowed to search for the effect of sample rotation on the images. Identical images were obtained when the diamond stylus scanned different etched tungsten tips, illustrating an interchange in the roles of tip and sample.
- OSTI ID:
- 5254687
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 9:2; ISSN 0734-211X; ISSN JVTBD
- Country of Publication:
- United States
- Language:
- English
Similar Records
Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition
Characterization of atomic force microscope tips by adhesion force measurements
Journal Article
·
Sun Mar 15 04:00:00 UTC 2015
· Review of Scientific Instruments
·
OSTI ID:22392433
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition
Journal Article
·
Tue Nov 15 04:00:00 UTC 2011
· Review of Scientific Instruments
·
OSTI ID:22063750
Characterization of atomic force microscope tips by adhesion force measurements
Journal Article
·
Mon Oct 11 04:00:00 UTC 1993
· Applied Physics Letters; (United States)
·
OSTI ID:6200990