Noise properties in an rf-biased Josephson junction noise thermometer

Journal Article · Thu Mar 15 04:00:00 EST 1984 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.333417· OSTI ID:5254120

Seppae, H

Frequency fluctuation in an rf-biased R-SQUID noise thermometer operating in an nonhysteretic mode is examined. The noise sources caused by the shunt resistor and by the dissipative elements in the tank circuit are included in the model. The results demonstrate that the noise in the tank circuit has a significant influence on the accuracy of the Josephson junction noise thermometer.

• Research Organization: Electrical Engineering Laboratory, Technical Research Centre of Finland, Otakaari 5 I, SF-02150 Espoo 15, Finland
• OSTI ID: 5254120
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 55:6; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CURRENTS
ELECTRIC CURRENTS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FLUXMETERS
FREQUENCY DEPENDENCE
FREQUENCY RESPONSE TESTING
HYSTERESIS
JOSEPHSON JUNCTIONS
JUNCTIONS
MEASURING INSTRUMENTS
MICROWAVE EQUIPMENT
NOISE
OPERATION
OSCILLATIONS
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTING JUNCTIONS
TESTING
THERMOMETERS