X-ray fluorescence spectrometer

Patent · Tue Nov 22 00:00:00 EST 1983

OSTI ID:5248968

Anisovich, K V; Komyak, N I; Menbaev, Z K

An X-ray fluorescence spectrometer is disclosed comprising an X-ray source, a sample holder spaced from the X-ray source at a distance which ensures the illumination of the central portion of the sample not less than 0.3 ZU erg./s.cm/sup 2/.w, where Z is the atomic weight of material of the X-ray anode and U is the voltage across the X-ray source, in kilovolts. The spectrometer further comprises a curved analyzing crystal for focusing the fluorescent radiation of the sample at an X-ray detector. The analyzing crystal and the detector are installed in an evacuated chamber. The X-ray source and the sample holder are positioned outside the evacuated chamber which has a window for passing X-ray radiation. The sample holder is positioned so that the average distance between the sample surface portion which produces radiation incident on the analyzing crystal and the window does not exceed the distance between said sample surface portion and the focus of the X-ray source.

• Assignee: Leningradskoe NPO ''Burevestnik'' (Union of Soviet Socialist Republics)
• Patent Number(s): US 4417355
• OSTI ID: 5248968
• Resource Relation: Patent Priority Date: Priority date 8 Jan 1981, Union of Soviet Socialist Republics (USSR); Other Information: PAT-APPL-223268
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
X-RAY SPECTROMETERS
DESIGN
FLUORESCENCE SPECTROSCOPY
SAMPLE HOLDERS
X-RAY FLUORESCENCE ANALYSIS
X-RAY SOURCES
CHEMICAL ANALYSIS
EMISSION SPECTROSCOPY
EQUIPMENT
MEASURING INSTRUMENTS
NONDESTRUCTIVE ANALYSIS
RADIATION SOURCES
SPECTROMETERS
SPECTROSCOPY
X-RAY EMISSION ANALYSIS
X-RAY EQUIPMENT
440105* - Radiation Instrumentation- Radiometric Instruments- (-1987)