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Optical techniques to evaluate shield/insulation interfaces in XLPE cables

Conference ·
OSTI ID:524593
; ; ;  [1];  [2]
  1. Ontario Hydro Technologies, Toronto, Ontario (Canada)
  2. Queen`s Univ., Kingston, Ontario (Canada). Dept. of Physics
Contaminants and protrusions at the shield/insulation interfaces of polymer-insulated high-voltage cables can be the initiation sites of water, and electrical treeing which lead to insulation failure. The smoothness of the interfaces is, therefore, of critical importance to the long-term performance of cables. An optical technique to evaluate the surfaces of extruded semiconducting tapes and also shield/insulation interfaces of cables is described. The results presented demonstrate the feasibility of the technique on both tapes and cables. A comparison of the measurements of protrusions on extruded tapes using the technique and SEED is included.
OSTI ID:
524593
Report Number(s):
CONF-960614--; ISBN 0-7803-3531-7
Country of Publication:
United States
Language:
English

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