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Periodic structural models and radial distribution functions of SiO/sub x/: x = 0. to 2

Conference ·
OSTI ID:5242835
A series of random network structural models with periodic boundary conditions for SiO/sub x/ for x range from 0. (pure amorphous Si) to 2. (pure vitreous silica) within the context of microscopic random bond mixing model have been constructed. A Keating type of potential is used in the computer relaxation process. These cubic models which have 54 Si atoms and variable number of O atoms have no internal voids or dangling bonds. Each O atom binds to two Si atoms in a non-linear bridging position while each Si atom binds to four other atoms (Si or O) in a tetrahedral configuration. The densities, radial distribution functions (RDF) and partial RDF are studied as a function of x and are compared with available x-ray scattering data. It is found that for cases of x not equal to 0. or 2., the Si-Si bond lengths tend to be larger and Si-O bond lengths tend to be shorter than their respective crystalline bond lengths. Utilization of these structural models in the electronic and vibrational calculations is also discussed.
Research Organization:
Missouri Univ., Kansas City (USA). Dept. of Physics
DOE Contract Number:
AC02-79ER10462
OSTI ID:
5242835
Report Number(s):
CONF-800647-4
Country of Publication:
United States
Language:
English

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