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Title: Single and double [ital K]-shell ionization and electron-transfer cross sections for Fe and Ni bombarded by S ions and Fe by Si ions at 1. 25--4. 70 MeV/amu

Journal Article · · Physical Review A; (United States)
; ;  [1]; ;  [2]
  1. Tata Institute of Fundamental Research, Bombay 400005 (India)
  2. Department of Physics, Kansas State University, Manhattan, Kansas (United States)

Single and double [ital K]-shell vacancy production and [ital K]-[ital K] electron-transfer cross sections have been measured in the limit of zero target thickness for Fe and Ni induced by 1.25--4.70 MeV/amu [sup 28]Si and [sup 32]S ions. The fluorescence yield [omega][sub [ital k]] for Fe and Ni at x-ray emission was determined from the measured energy shifts of target [ital K] x rays, the intensity ratios of [ital K][beta] and [ital K][alpha] and using the statistical scaling procedure of Larkins [J. Phys. B 4, L29 (1971)]. The single-electron-transfer cross sections are compared with the atomic-orbital-expansion model (AO) of Fritsch and Lin [Phys. Rep. 202, 1 (1991)], and the semiempirical perturbed-stationary-state (PSS) approach of Lapicki and McDaniel [Phys. Rev. A 22, 1896 (1980)]. The AO calculations show excellent agreement with the single [ital K]-[ital K] transfer cross sections. This model also explains the double [ital K]-[ital K] transfer data quite well although it underestimates slightly the measured values. The direct [ital K]-shell ionization cross section data are compared with the ECPSSR (perturbed-stationary-state theory with energy-loss, Coulomb deflection, and relativistic corrections) calculations.

OSTI ID:
5223938
Journal Information:
Physical Review A; (United States), Vol. 49:2; ISSN 1050-2947
Country of Publication:
United States
Language:
English