Atomistic study of crack propagation and dislocation emission in Cu-Ni multilayers
Book
·
OSTI ID:522322
- Virginia Polytechnic Inst. and State Univ., Blacksburg, VA (United States). Dept. of Materials Science and Engineering
The authors present atomistic simulations of the crack tip configuration in multilayered Cu-Ni materials. The simulations were carried out using molecular statics and EAM potentials. The atomistic structure of the interface was studied first for a totally coherent structure. Cracks were simulated near a Griffith condition in different possible configurations of the crack plane and front with respect to the axis of the layers. Results show that interface effects predominantly control the mechanical behavior of the system studied.
- Sponsoring Organization:
- Office of Naval Research, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
- OSTI ID:
- 522322
- Report Number(s):
- CONF-961202--; ISBN 1-55899-361-4
- Country of Publication:
- United States
- Language:
- English
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