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Pumping of inert gases by electron-impact ionization sources and associated memory effects

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.572625· OSTI ID:5220385
Radioactive /sup 85/Kr was used in a closed volume under moderate vacuum to investigate mechanisms by which inert gas atoms are pumped in an electron-impact ionization source of a simple diode design. Results are consistent with a mechanism involving the conversion of inert gas ions into energetic neutrals at the cathode followed by reflection and trapping of some of the neutral atoms in nearby surfaces. We discuss the possibility that the source pumping speed is enhanced due to burial of the trapped neutrals by material released in low-energy sputtering processes. The implications of these results for reducing memory effects in UHV mass spectrometer systems are discussed.
Research Organization:
Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
DOE Contract Number:
W-7405-ENG-26
OSTI ID:
5220385
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 2:1; ISSN JVTAD
Country of Publication:
United States
Language:
English