Charge distribution of Ar recoil ions produced in one- and two-electron capture collisions by 16-MeV O sup q + projectiles
- Cyclotron Institute and Department of Chemistry, Texas A M University, College Station, Texas 77843 (US)
The yields of Ar recoil ions produced in collisions with 16-MeV O{sup {ital q}+} ({ital q}=3--8) were measured in coincidence with one- and two-electron capture by the projectile. Time-of-flight analysis identified the charges of the Ar recoil ions and enabled the determination of charge-state distributions. The independent-electron approximation was employed along with a simple exponential parametrization of the ionization and capture probabilities to calculate the cross sections for multiple ionization accompanied by one- and two-electron capture. By accounting for direct {ital L}-shell ionization and Auger multiplication of {ital L}-shell vacancies, good agreement between calculated and measured charge-state distributions was attained.
- OSTI ID:
- 5219074
- Journal Information:
- Physical Review (Section) A: General Physics; (USA), Journal Name: Physical Review (Section) A: General Physics; (USA) Vol. 40:10; ISSN PLRAA; ISSN 0556-2791
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ARGON
ATOM COLLISIONS
AUGER EFFECT
CAPTURE
CHARGE STATES
CHARGED PARTICLES
COLLISIONS
ELECTRON CAPTURE
ELEMENTS
ENERGY RANGE
FLUIDS
GASES
ION COLLISIONS
ION-ATOM COLLISIONS
IONIZATION
IONS
MEV RANGE
MULTICHARGED IONS
NONMETALS
OXYGEN IONS
RARE GASES
RECOILS