Measurement of thin film's magnetostriction with piezoelectric ceramic substrates

Conference · Fri Sep 01 00:00:00 EDT 1989 · IEEE (Institute of Electrical and Electronics Engineers) Transactions on Magnetics; (USA)

OSTI ID:5211182

Arai, K I; Yamaguchi, M; Muranaka, C S ^[1]

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1. Research Institute of Electrical Communication, Tohoku Univ., 2-1-1 Katahira, Sendai 980 (JP)

The authors propose a new method to measure magnetostriction of magnetic thin films using piezoelectric ceramic substrates and some feedback circuits. Conventional methods are based on the measurement of the bonding of a cantilevered substrate sample wlith a magnetic film when a magnetic field is applied in the plane of the film. The main idea of the developed method is to compensate any bending along the sample's length, changing the length of the substrate using the inverse piezoelectric effect, by the same amount of the thin films's change of length (caused by the magnetostriction).

• OSTI ID: 5211182
• Report Number(s): CONF-890309--
• Journal Information: IEEE (Institute of Electrical and Electronics Engineers) Transactions on Magnetics; (USA), Journal Name: IEEE (Institute of Electrical and Electronics Engineers) Transactions on Magnetics; (USA) Vol. 25:5; ISSN IEMGA; ISSN 0018-9464
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ELEMENTS
FILMS
MAGNETIC FIELDS
MAGNETIC PROPERTIES
MEASURING METHODS
METALS
NICKEL
PHYSICAL PROPERTIES
RELIABILITY
THIN FILMS
TRANSITION ELEMENTS