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Title: Dependence of perovskite/pyrochlore phase formation on oxygen stoichiometry in PLT thin films

Abstract

Thin films in the Pb--La--Ti--O (PLT) system were prepared under two different oxygen partial pressure ([ital P][sub O[sub 2]]) conditions by multi-ion-beam reactive sputtering (MIBERS). The oxidation of the depositing species was determined from the deposition rate dependence on [ital P][sub O[sub 2]] and the [ital P][sub O[sub 2]] dependence of the positive secondary ion emission from the sputtering targets. Films deposited at high [ital P][sub O[sub 2]] ([ital P][sub O[sub 2]] greater than the critical partial pressure for oxidation of the Pb target surface) were fully oxidized, and they formed the pyrochlore phase during annealing. The low [ital P][sub O[sub 2]] condition ([ital P][sub O[sub 2]] less than or equal to the critical partial pressure for oxidation of the Pb target surface) caused sputtering of incompletely oxidized Pb species, and the resulting oxygen deficient films produced phase-pure perovskite. The formation of the pyrochlore phase at high [ital P][sub O[sub 2]] and the perovskite phase at low [ital P][sub O[sub 2]] is independent of Pb content within the film; the phase formation is dependent on the oxidation state of the Pb, which is sensitive to both the [ital P][sub O[sub 2]] and the sputtering rate of the Pb. A perovskite/pyrochloremore » phase formation model (PPFM) that incorporates annealing time, temperature, and heating rate, and thin film oxygen deficiency was developed to explain the formation of the perovskite and pyrochlore phase during post-deposition annealing of PLT thin films.« less

Authors:
;  [1]
  1. (Materials Research Laboratory, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States))
Publication Date:
OSTI Identifier:
5186040
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Journal Article
Journal Name:
Journal of Materials Research; (United States)
Additional Journal Information:
Journal Volume: 9:3; Journal ID: ISSN 0884-2914
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; LANTHANUM OXIDES; ANNEALING; PHASE STUDIES; SPUTTERING; LEAD OXIDES; TITANIUM OXIDES; ION BEAMS; OXYGEN; PARTIAL PRESSURE; PEROVSKITES; PYROCHLORE; THIN FILMS; BEAMS; CHALCOGENIDES; ELEMENTS; FILMS; HEAT TREATMENTS; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; MINERALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; 360202* - Ceramics, Cermets, & Refractories- Structure & Phase Studies

Citation Formats

Fox, G.R., and Krupanidhi, S.B. Dependence of perovskite/pyrochlore phase formation on oxygen stoichiometry in PLT thin films. United States: N. p., 1994. Web. doi:10.1557/JMR.1994.0699.
Fox, G.R., & Krupanidhi, S.B. Dependence of perovskite/pyrochlore phase formation on oxygen stoichiometry in PLT thin films. United States. doi:10.1557/JMR.1994.0699.
Fox, G.R., and Krupanidhi, S.B. Tue . "Dependence of perovskite/pyrochlore phase formation on oxygen stoichiometry in PLT thin films". United States. doi:10.1557/JMR.1994.0699.
@article{osti_5186040,
title = {Dependence of perovskite/pyrochlore phase formation on oxygen stoichiometry in PLT thin films},
author = {Fox, G.R. and Krupanidhi, S.B.},
abstractNote = {Thin films in the Pb--La--Ti--O (PLT) system were prepared under two different oxygen partial pressure ([ital P][sub O[sub 2]]) conditions by multi-ion-beam reactive sputtering (MIBERS). The oxidation of the depositing species was determined from the deposition rate dependence on [ital P][sub O[sub 2]] and the [ital P][sub O[sub 2]] dependence of the positive secondary ion emission from the sputtering targets. Films deposited at high [ital P][sub O[sub 2]] ([ital P][sub O[sub 2]] greater than the critical partial pressure for oxidation of the Pb target surface) were fully oxidized, and they formed the pyrochlore phase during annealing. The low [ital P][sub O[sub 2]] condition ([ital P][sub O[sub 2]] less than or equal to the critical partial pressure for oxidation of the Pb target surface) caused sputtering of incompletely oxidized Pb species, and the resulting oxygen deficient films produced phase-pure perovskite. The formation of the pyrochlore phase at high [ital P][sub O[sub 2]] and the perovskite phase at low [ital P][sub O[sub 2]] is independent of Pb content within the film; the phase formation is dependent on the oxidation state of the Pb, which is sensitive to both the [ital P][sub O[sub 2]] and the sputtering rate of the Pb. A perovskite/pyrochlore phase formation model (PPFM) that incorporates annealing time, temperature, and heating rate, and thin film oxygen deficiency was developed to explain the formation of the perovskite and pyrochlore phase during post-deposition annealing of PLT thin films.},
doi = {10.1557/JMR.1994.0699},
journal = {Journal of Materials Research; (United States)},
issn = {0884-2914},
number = ,
volume = 9:3,
place = {United States},
year = {1994},
month = {3}
}