Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Stability, thermal behavior and crystal structure of ion ordered Bi{sub 1-x}Ln{sub x}O{sub 1.5} phases (Ln = Sm-Dy)

Journal Article · · Journal of Solid State Chemistry
; ; ;  [1];  [2]
  1. Ecole Nationale Superieure de Chimie de Lille and Universite des Sciences et Technologies de Lille, Villeneuve (France)
  2. National Institute for Research in Inorganic Materials, Ibaraki (Japan)
This paper deals with the bcc Bi{sub 1-x}Ln{sub x}O{sub 1.5} phases recently isolated in the composition range 0.275 {le} x {le} 0.40 depending on the lanthanide substituent (Ln = Sm, Eu, Gd, Tb, Dy). These phases are slowly obtained by long time annealing ({approx_equal} 1500 hr) of the corresponding fcc {delta}-Bi{sub 3}O{sub 3} type phase at about 800{degrees}C, and exhibit a cell parameter almost twice the fcc parameter. X-ray diffraction investigations of the stability and crystal structure properties of the phases during thermal treatments have clearly shown that they are stable only in the temperature range 800-1000{degrees}C, depending on the lanthanide substituent. Below 800{degrees}C, they are metastable, but an annealing treatment or a slow dynamic thermal treatment between 600 and 800{degrees}C leads to a partial transformation into the true low temperature stable phases of the systems. Above 1000{degrees}C the fast transformation bcc to fcc {delta}-Bi{sub 2}O{sub 3} type occurs systematically. The crystal structure of bcc Bi{sub 0.65}Gd{sub 0.35}O{sub 1.5} has been refined with a= 11.0488(1) {Angstrom}, 12{sub 1}3 space group (Z = 32), using the Rietveld method. Starting from a {delta}-Bi{sub 2}O{sub 3} type phase, the formation of this bcc phase can be explained on the basis of a structural disorder-order transformation as a result of a long time annealing process at high temperature.
OSTI ID:
518426
Journal Information:
Journal of Solid State Chemistry, Journal Name: Journal of Solid State Chemistry Journal Issue: 1 Vol. 129; ISSN 0022-4596; ISSN JSSCBI
Country of Publication:
United States
Language:
English