HAST evaluation of organic liquid IC encapsulants using Sandia's assembly test chips
Accelerated aging (HAST) experiments have been conducted with special purpose corrosion test chips(ATCs) in both bare die form and with various liquid encapsulants; epoxy, silicone and silicone elastomer, or silicone gel. The purpose of the experiment was to show what incremental improvement in die corrosion resistance was provided by the encapsulants and to determine the failure modes for the two types of samples. The test conditions were 140{degrees}C/85% RH, +40 V bias on outer tracks with respect to the center track. In the case of non-encapsulated parts, we observed median lifetimes {approx} 1000 h for the best passivations, with the predominate failure mode being triple track corrosion on the die. In the case of the encapsulated parts, the failure mode depended on the encapsulant type. Several of the silicone gel materials showed excellent HAST performance, with only a few percent failures at the 1100 h point. 16 refs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5182122
- Report Number(s):
- SAND-91-2578C; CONF-9205185--1; ON: DE92015042
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
AGING
CHALCOGENIDES
COATINGS
CORROSION PROTECTION
DEPOSITION
ELASTOMERS
ELECTRONIC CIRCUITS
ENCAPSULATION
EPOXIDES
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
MOISTURE
ORGANIC COMPOUNDS
ORGANIC OXYGEN COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
POLYMERS
SILICON COMPOUNDS
SILICON OXIDES
SURFACE COATING