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Reactive ion etching of indium-tin-oxide films

Journal Article · · Journal of the Electrochemical Society; (USA)
DOI:https://doi.org/10.1149/1.2097042· OSTI ID:5179299
; ; ;  [1]
  1. California Univ., Berkeley, CA (USA). Dept. of Electrical Engineering and Computer Sciences
Oxygen deficient indium-tin-oxide (ITO) films exhibit a high electrical conductivity combined with high transmission in the visible spectral region. This combination of properties has led to its many electo-optic applications, mainly as transparent electrode in various devices. To take full advantage of ITO films in current and future devices, fine-line patterning methods must be developed for this material. The wet etch techniques that are commonly used in etching of ITO are not satisfactory. Reactive ion etching (RIE) combines the advantages of sputter etching, which is highly anisotropic but not selective, with those of plasma etching, which is selective but not anisotropic. The combined process (RIE) is both selective and highly anisotropic. This paper describes a RIE process for ITO using HI gas as an etchant.
OSTI ID:
5179299
Journal Information:
Journal of the Electrochemical Society; (USA), Journal Name: Journal of the Electrochemical Society; (USA) Vol. 136:6; ISSN JESOA; ISSN 0013-4651
Country of Publication:
United States
Language:
English