Ion-beam depth-profiling studies of leached glasses
Ion-beam depth-profiling was carried out on three different glasses leached (or hydrated) in deionized water using /sup 1/H(/sup 19/F,..cap alpha gamma..)/sup 16/O nuclear reaction, secondary ion mass spectrometry (SIMS) and sputter-induced photon spectrometry (SIPS) techniques. The depth-profiles show an interdiffusion mechanism in which the sodium ions in the glass are depleted and replaced by hydrogen (H/sup +/) or hydronium (H/sub 3/O/sup +/) ions from the solution. The leaching behavior does not show significant difference whether the glass surface is fractured or polished. Problems of mobile ion migration caused by ion bombardment and loss of hydrogen during analysis are discussed.
- Research Organization:
- Oak Ridge National Lab., TN (USA); Pennsylvania State Univ., University Park (USA). Materials Research Lab.
- DOE Contract Number:
- W-7405-ENG-26; AC02-76ER02754
- OSTI ID:
- 5147652
- Report Number(s):
- CONF-8106132-2; ON: DE82018176
- Country of Publication:
- United States
- Language:
- English
Similar Records
Elemental depth profiling of nuclear waste glasses after two-years burial in a salt geology
An Investigation of Hydrogen Depth Profiling Using ToF-SIMS