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Title: Method of making passivated antireflective coating for photovoltaic cell

Patent ·
OSTI ID:5139592

This patent describes a method of fabricating a point contact photovoltaic cell. It comprises: providing a semiconductor substrate, oxidizing the surfaces of the semiconductor substrate, forming doped regions of p-conductivity type and n-conductivity type in a first major surface of the substrate; forming first and second metallization layers for interconnecting the plurality of doped regions, depositing silicon nitride on the first and second metallization layers as an etchant protection layer, thinning the substrate by etching a second major surface opposite from the first major surface, and forming a layer of antireflective material on the second major surface.

Assignee:
Electric Power Research Inst., Palo Alto, CA (USA)
Patent Number(s):
US 5011782; A
Application Number:
PPN: US 7-322387
OSTI ID:
5139592
Resource Relation:
Patent File Date: 31 Mar 1989
Country of Publication:
United States
Language:
English