Absence of ferromagnetism in epitaxial films of ultrathin Pd, Rh, and Rh on Pd grown on Au(100)
Journal Article
·
· Physical Review, B: Condensed Matter; (United States)
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
{ital In} {ital situ} longitudinal and polar Kerr-effect measurements were used to search for ferromagnetism in films of Pd/Au(100), Rh/Au(100), and Rh/Pd/Au(100) with overlayer thicknesses of 0.5--5 monolayers (ML). No evidence for ferromagnetism was found in these systems above 100 K and for applied magnetic fields up to 2.2 kOe. Based on our low-energy-electron-diffraction and Auger data, we find that all three systems grow epitaxially, and that there is layer-by-layer growth for Pd/Au(100) at 300 K, layer growth for Rh/Au(100) at 100 K up to 2 ML followed by island formation, and layer growth for Rh/Pd/Au(100) at 100 K.
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 5133200
- Journal Information:
- Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 44:21; ISSN 0163-1829; ISSN PRBMD
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
AUGER ELECTRON SPECTROSCOPY
COHERENT SCATTERING
DIELECTRIC PROPERTIES
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTRON DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
EPITAXY
FERROMAGNETISM
FILMS
KERR EFFECT
MAGNETISM
METALS
PALLADIUM
PHYSICAL PROPERTIES
PLATINUM METALS
RHODIUM
SCATTERING
SPECTROSCOPY
THIN FILMS
TRANSITION ELEMENTS
360104* -- Metals & Alloys-- Physical Properties
AUGER ELECTRON SPECTROSCOPY
COHERENT SCATTERING
DIELECTRIC PROPERTIES
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTRON DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
EPITAXY
FERROMAGNETISM
FILMS
KERR EFFECT
MAGNETISM
METALS
PALLADIUM
PHYSICAL PROPERTIES
PLATINUM METALS
RHODIUM
SCATTERING
SPECTROSCOPY
THIN FILMS
TRANSITION ELEMENTS