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Interpretation of resistivity of Nd sub 1. 85 Ce sub 0. 15 CuO sub 4 minus y using the electron-phonon spectral function determined from tunneling data

Journal Article · · Physical Review, B: Condensed Matter; (United States)
; ;  [1];  [2]
  1. Department of Physics, Illinois Institute of Technology, Chicago, Illinois 60616 (United States)
  2. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Tunneling measurements of {alpha}{sup 2}{ital F}({omega}) of Nd{sub 1.85}Ce{sub 0.15}CuO{sub 4{minus}{ital y}} are shown to be in good agreement with recent published results of the phonon density of states {ital F}({omega}) from neutron scattering. The locations of peaks and valleys in both functions are similar, but the spectral weights differ, suggesting that {alpha}{sup 2} has a strong energy dependence. We have used {alpha}{sup 2}{ital F}({omega}) to estimate the phonon contribution, {rho}{sub phonon}({ital T}), to published data of the temperature-dependent resistivity, {rho}({ital T}), for thin films and single crystals of Nd{sub 1.85}Ce{sub 0.15}CuO{sub 4{minus}{ital y}}. When the phonon contribution is subtracted from the experimental data, a clear {ital T}{sup 2} contribution remains over most of the temperature range. The {ital T}{sup 2} contribution is interpreted to be due to three-dimensional electron-electron scattering, {rho}{sub {ital e}-{ital e}}. There is also a correlation between the magnitude of {rho}{sub {ital e}-{ital e}}, and the value of the plasma frequency, {omega}{sub {ital p}} (obtained from the determination of {rho}{sub phonon}({ital T})), with a scaling which approximates {omega}{sub {ital p}}{sup {minus}10/3}. Such a scaling is expected from the carrier-concentration dependence of electron-electron scattering.

OSTI ID:
5131694
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 44:21; ISSN 0163-1829; ISSN PRBMD
Country of Publication:
United States
Language:
English