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Title: Soft x-ray absorption spectroscopy. Electronic and morphological structure of poly(vinylidene fluoride)

Journal Article · · J. Am. Chem. Soc.; (United States)
DOI:https://doi.org/10.1021/ja00538a003· OSTI ID:5130366

X-ray absorption studies were carried out for the first time on a polymeric thin film in the energy range 250 to 1000 eV, thereby providing access to the K edges of light elements. The carbon and fluorine K edges were studied in poly(vinylidene fluoride). Sharp peaks were observed at both edges, and extended fine structure (EXAFS) was found at higher energies. The carbon K edge showed compound structure, with a chemical shift of 3.9 eV between the Cl(1s) absorption energies in CH/sub 2/ and CF/sub 2/ groups. This type of shift is similar to, but not identical with, ESCA shifts. Fourier transformation of EXAFS structure above the F K edge yielded a C to F bond distance of 1.38 +- 0.02 A and a second peak at 2.45 +- 0.08 A, which is comprised of contributions from several neighbor shells, providing evidence of structural order. This method is concluded to be useful in studying polymeric electronic structure and molecular conformation.

DOE Contract Number:
W-7405-ENG-48
OSTI ID:
5130366
Journal Information:
J. Am. Chem. Soc.; (United States), Vol. 102:18
Country of Publication:
United States
Language:
English

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