Characterization of RF sputtered ZnO piezoelectric films using transmission electron microscope
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 5127907
- Report Number(s):
- LBL-3775; CONF-750825-3
- Resource Relation:
- Journal Volume: 33; Conference: 33. annual meeting of the Electron Microscopy Society of America, Las Vegas, NV, USA, 11 Aug 1975
- Country of Publication:
- United States
- Language:
- English
Similar Records
Nanosecond Time Resolved Electron Diffraction Studies of the (Alpha) to (Beta) Transition in Pure Ti Thin Films using the Dynamic Transmission Electron Microscope (DTEM)
In-situ Studies of the Martensitic Transformation in Ti Thin Films using the Dynamic Transmission Microscope (DTEM)
Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy
Conference
·
Fri Dec 09 00:00:00 EST 2005
·
OSTI ID:5127907
+2 more
In-situ Studies of the Martensitic Transformation in Ti Thin Films using the Dynamic Transmission Microscope (DTEM)
Conference
·
Mon Nov 21 00:00:00 EST 2005
·
OSTI ID:5127907
+6 more
Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy
Conference
·
Tue Dec 31 00:00:00 EST 1996
·
OSTI ID:5127907