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Imaging properties of a delay line readout using large microchannel plates

Journal Article · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/23.289290· OSTI ID:5112547
; ;  [1]
  1. Virginia Univ., Charlottesville, VA (United States). Dept. of Physics
This paper reports on the modal gain that varied over the surface of the microchannel plates (MCPs) by as much as a factor of three, both before and after extensive UV scrubbing. Attempts to decrease the variations in gain by further full flood scrubbing, and by spot scrubbing the high gain areas, were unsuccessful, the fwhm of the charge distributions were 100% before the scrubbing, and improved to 45% afterwards. Characteristic deviations from spatial linearity for the delay line anode are presented. For positions within a diameter of 120 mm, the deviations form linearity were less than {plus minus}150 {mu}m. For MCP gains greater than 3 {times} 10{sup 6}, the fwhm spatial resolution was measured. The resolution at the center of the MCPs was 54 {mu}m, while at the edge (57 mm from the center) it was 64 {mu}m.
OSTI ID:
5112547
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:2; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English