Spectrum of thermal voltage fluctuations in current-driven, small-capacitance Josephson junctions

Journal Article · Tue Jun 01 00:00:00 EDT 1982 · J. Low Temp. Phys.; (United States)

DOI:https://doi.org/10.1007/BF00683990· OSTI ID:5112445

Arai, M R; Ambegaokar, V

We have calculated the spectrum of thermally induced voltage fluctuations in a small-capatitance, current-driven Josephson junction, within the resistively shunted model but with no other approximations. We exploit a novel representation of the solution to the initial value problem for the diffusion of the phase to reduce the fluctuation spectrum to integrals. Numerical results are presented.

• Research Organization: Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York
• OSTI ID: 5112445
• Journal Information: J. Low Temp. Phys.; (United States), Vol. 47:5
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
JOSEPHSON JUNCTIONS
ELECTRIC POTENTIAL
BOUNDARY-VALUE PROBLEMS
CORRELATION FUNCTIONS
DIFFUSION
EIGENVALUES
FLUCTUATIONS
FOKKER-PLANCK EQUATION
DIFFERENTIAL EQUATIONS
EQUATIONS
FUNCTIONS
JUNCTIONS
PARTIAL DIFFERENTIAL EQUATIONS
SUPERCONDUCTING JUNCTIONS
VARIATIONS
420201* - Engineering- Cryogenic Equipment & Devices