Electron microscopy of in-situ ion beam sputtered amorphous Gd-Fe alloy thin films

Journal Article · Wed Mar 01 00:00:00 EST 1978 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.324853· OSTI ID:5096488

Gill, H S; Chen, M; Judy, J H

We have investigated the physical microstructure and Lorentz magnetic structure of in-situ ion beam sputtered and RF sputtered amorphous Gd-Fe alloy thin films. Auger electron spectroscopy was used to determine the composition profile and thickness of the films. Films with 18 to 30 at.% Gd were deposited onto amorphous carbon substrates up to 500 A inside a modified RCA-EMU4 electron microscope. Two diffused electron diffraction halos were observed indicating amorphous phase separation. Using high-resolution dark-field microscopy with a JEOL (JEM-100C) electron microscope, we observed coherent scattering regions of approximately 8--20 A diameter. In conclusion, amorphous Gd-Fe alloy films exhibit amorphous phase separation/quasi-amorphous structure, in-plane magnetization ripple and crosstie walls, and stress-induced anisotropy.

• Research Organization: University of Minnesota, Minneapolis, Minnesota 55455
• OSTI ID: 5096488
• Journal Information: J. Appl. Phys.; (United States), Vol. 49:3
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
GADOLINIUM ALLOYS
MICROSTRUCTURE
IRON ALLOYS
AMORPHOUS STATE
ANISOTROPY
BINARY ALLOY SYSTEMS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
FILMS
MAGNETIZATION
PHASE STUDIES
SPUTTERING
ALLOY SYSTEMS
ALLOYS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
MICROSCOPY
RARE EARTH ALLOYS
SCATTERING
360102* - Metals & Alloys- Structure & Phase Studies