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U.S. Department of Energy
Office of Scientific and Technical Information

External micro ion-beam analysis (X-MIBA)

Conference ·
;  [1];  [2]
  1. Sandia National Labs., Albuquerque, NM (USA)
  2. Idaho State Univ., Pocatello, ID (USA)

In-air or external ion beam analysis combined with 10--100 {mu}m spatial resolution, is a truly unique feature of the nuclear microprobe technique. PIXE has been performed externally for many years, but recently, other IBA techniques such as backscattering and nuclear reaction depth profiling measurements have been made in air. Presently, the use of eXternal Micro Ion-Beam Analysis, or X-MIBA, is being attempted at a growing number of microprobe facilities; however, the full potential of this new technique remains relatively unexploited. This paper will review the X-MIBA technique with emphasis on optimization of exit foil geometries, beam focusing and spot size considerations, external IBA techniques, and radiation hazards associated with the direct and scattered beam, nuclear reaction products and radionuclei production in the air. The unique in-air analysis advantages of no pump down, and essentially unrestricted sample size or state (solid, liquid etc.), has resulted in a myriad of applications of this technique at Sandia, which are featured as examples. 52 refs., 8 figs., 2 tabs.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Organization:
DOE/DP
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5088068
Report Number(s):
SAND-89-2967C; CONF-900223--1; ON: DE90006277
Country of Publication:
United States
Language:
English