A dielectric loss investigation of moisture in epoxy-glass composites

Journal Article · Mon Dec 31 23:00:00 EST 1984 · IBM J. Res. Dev.; (United States)

DOI:https://doi.org/10.1147/rd.291.0018· OSTI ID:5087964

Marsh, L L; Kotkiewicz, S M; VanHart, D C

Dielectric loss has been used to study moisture absorption-desorption equilibria and kinetics in epoxy-glass composites. Measurements were made at a temperature of 90/sup 0/ C and a frequency of 200 Hz to maximize sensitivity to interfacial or Maxwell-Wagner polarization. Exposure to various partial pressures of moisture at that temperature permitted a kinetics analysis from which an estimate was made of the diffusivity of water in the composites. Values of dielectric loss at saturation were used to establish a moisture/dielectric loss calibration at 90/sup 0/ C which can be used to estimate the macroscopic internal moisture content of coupon samples and printed circuit cards and boards. Dielectric loss measurements offer promise as a screening technique for resin-glass coupler development.

• Research Organization: IBM Systems, Technology Division, Endicott, NY
• OSTI ID: 5087964
• Journal Information: IBM J. Res. Dev.; (United States), Journal Name: IBM J. Res. Dev.; (United States) Vol. 29:1; ISSN IBMJA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ABSORPTION
CHEMICAL REACTION KINETICS
COMPOSITE MATERIALS
DESORPTION
DIELECTRIC PROPERTIES
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
ENERGY LOSSES
EPOXIDES
EQUILIBRIUM
GLASS
KINETICS
LOSSES
MATERIALS
MEASURING METHODS
MOISTURE
ORGANIC COMPOUNDS
ORGANIC OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PRINTED CIRCUITS
REACTION KINETICS