Surface studies on the thermite mixture of Al/Cu/sub 2/O. II. Thickness measurements of carbon and of aluminum oxide on aluminum, and changes in copper chemistry

Technical Report · Fri Oct 10 04:00:00 EDT 1980

DOI:https://doi.org/10.2172/5070462· OSTI ID:5070462

Rengan, A; Haws, L D; Moddeman, W E; Wang, P S

Improved surface analysis techniques of x-ray induced photoelectron spectroscopy (XPS) and high resolution Auger spectroscopy (AES) were used to study thermite materials. The thermite under examination was a powdered mixuture of aluminum metal and cuprous oxide in a mole ratio of 2/3. These improved techniques were used to examine the surfaces of the aluminum metal and of the cuprous oxide for the presence, the amount, and the thickness of contaminants. Carbon, aluminum oxide, cupric oxide, and metallic-like copper were found on the reactants and mixtures. XPS and AES spectra of aluminum and copper are given, and equations are derived which allow for the calculation of carbon and oxide thicknesses.

• Research Organization: Mound Facility, Miamisburg, OH (USA)
• DOE Contract Number: AC04-76DP00053
• OSTI ID: 5070462
• Report Number(s): MLM-2752
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400201* -- Chemical & Physicochemical Properties
ALUMINIUM
AUGER ELECTRON SPECTROSCOPY
CARBON
CHALCOGENIDES
CHEMICAL REACTIONS
COPPER COMPOUNDS
COPPER OXIDES
ELECTRON SPECTROSCOPY
ELEMENTS
METALS
NONMETALS
OXIDATION
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
REDUCTION
SPECTROSCOPY
SURFACES
THERMITE PROCESS
TRANSITION ELEMENT COMPOUNDS