Dose-rate and total-dose radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor. Final report

Technical Report · Thu Aug 01 00:00:00 EDT 1991

OSTI ID:5068756

Siy, P F; Carter, J T; D'Addario, L R; Loeber, D A

The MITRE Corporation has performed in-flux radiation testing of the Texas Instruments TMS320C30 32-bit floating point digital signal processor in both total dose and dose rate radiation environments. This test effort has provided data relating to the applicability of the TMS320C30 in systems with total dose and/or dose rate survivability requirements. In order to accomplish these tests, the MITRE Corporation developed custom hardware and software for in-flux radiation testing. This paper summarizes the effort by providing an overview of the TMS320C30, MITRE's test methodology, test facilities, statistical analysis, and full coverage of the test results. (Author)

• Research Organization: Mitre Corp., Bedford, MA (United States)
• OSTI ID: 5068756
• Report Number(s): AD-A-239767/7/XAB; MTR-1119; CNN: F19628-89-C-0001
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIGITAL SYSTEMS
PHYSICAL RADIATION EFFECTS
DOSE RATES
PERFORMANCE TESTING
RADIATION HARDENING
SPECIFICATIONS
STATISTICS
TEST FACILITIES
HARDENING
MATHEMATICS
RADIATION EFFECTS
TESTING
440200* - Radiation Effects on Instrument Components
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