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Title: Index-of-refraction measurement of uranium hexafluoride vapor at 632. 8 and 457. 9 nanometers

Technical Report ·
OSTI ID:5034928

The index of refraction of uranium hexafluoride (UF/sub 6/) vapor was measured at 632.8 nanometers and 457.9 nanometers using a Michelson interferometer. The refractive index was determined from the fringe shifts of the interference pattern as the UF/sub 6/ gas was fed into the evacuated test cell of the interferometer. Measurements were made at room temperature and at pressures ranging from 0 to 90 torr. At a confidence level of 90%, the resulting equations for the index of refraction of UF/sub 6/ vapor at the two colors are: (n - 1) = (5.268 +- 0.010) x 10/sup -4/ P(torr)/T(K) at 632.8 nm; and (n - 1) = (5.414 +- 0.014) x 10/sup -4/ P(torr)/T(K) at 457.9 nm. A nonideality correction factor has been reported for UF/sub 6/. For the temperature and pressure range covered in this experiment, the correction factor was negligible; but for extrapolation of the data to higher pressures and temperatures, the correction factor should be included. The resulting equations are: (n - 1) = (5.233 +- 0.010) x 10/sup -4/ P(1 + AP)/T(K) at 632.8 nm; and (n - 1) = (5.381 +- 0.014) x 10/sup -4/ P(1 + AP)/T(K) at 457.9 nm, where A(torr/sup -1/) = 1622.1/T/sup 3/(K).

Research Organization:
Oak Ridge Gaseous Diffusion Plant, TN (USA)
DOE Contract Number:
W-7405-ENG-26
OSTI ID:
5034928
Report Number(s):
K/AIS-5003; ON: DE82020692
Country of Publication:
United States
Language:
English