Element-specific detection of organosilicon compounds by gas chromatography/atmospheric pressure microwave induced helium plasma spectrometry
Journal Article
·
· Anal. Chem.; (United States)
The gas chromatographic, element-specific detection of organosilicon compounds by atmospheric pressure microwave induced helium plasma spectrometry (GC/MIP) is investigated. At plasma temperatures, silicon is continuously removed from the walls of a quartz discharge tube. This results in a high silicon background response and poor experimental repeatability. Alumina and boron nitride are examined as discharge tubes. Background emission spectra are compared for helium plasmas contained within alumina, boron nitride, and quartz discharge tubes. Silicon detection limits, sensitivity, and selectivity are determined at optimized MIP conditions. A 4.5-pg silicon detection limit is obtained. Simultaneous multielement detection and empirical formula determinations are demonstrated for silicon-, carbon-, hydrogen-, and chlorine-containing compounds. 39 references, 6 figures, 4 tables.
- Research Organization:
- Univ. of Massachusetts, Amherst
- DOE Contract Number:
- AC02-77EV04320
- OSTI ID:
- 5031474
- Journal Information:
- Anal. Chem.; (United States), Journal Name: Anal. Chem.; (United States) Vol. 57:9; ISSN ANCHA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
400104 -- Spectral Procedures-- (-1987)
CHEMICAL ANALYSIS
CHROMATOGRAPHY
DATA
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EMISSION SPECTROSCOPY
EQUIPMENT
EXPERIMENTAL DATA
FLUIDS
GAS CHROMATOGRAPHY
GASES
HELIUM
INFORMATION
MICROWAVE EQUIPMENT
MICROWAVE TUBES
NONMETALS
NUMERICAL DATA
ORGANIC COMPOUNDS
ORGANIC SILICON COMPOUNDS
PLASMA
QUANTITATIVE CHEMICAL ANALYSIS
RARE GASES
SEPARATION PROCESSES
SPECTROSCOPY
TRACE AMOUNTS
400102* -- Chemical & Spectral Procedures
400104 -- Spectral Procedures-- (-1987)
CHEMICAL ANALYSIS
CHROMATOGRAPHY
DATA
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EMISSION SPECTROSCOPY
EQUIPMENT
EXPERIMENTAL DATA
FLUIDS
GAS CHROMATOGRAPHY
GASES
HELIUM
INFORMATION
MICROWAVE EQUIPMENT
MICROWAVE TUBES
NONMETALS
NUMERICAL DATA
ORGANIC COMPOUNDS
ORGANIC SILICON COMPOUNDS
PLASMA
QUANTITATIVE CHEMICAL ANALYSIS
RARE GASES
SEPARATION PROCESSES
SPECTROSCOPY
TRACE AMOUNTS