Modeling studies on the precipitation of Kr after implantation into metals
Conference
·
OSTI ID:5028149
A rate-theory approach is applied to interpreting observations on the precipitation of Kr injected into Ni at temperatures between 25 and 560/degree/C. At temperatures of 400/degree/C or higher, the implanted Kr precipitates evolve into a bi-modal size distribution containing small solid precipitates and an additional population of larger, faceted bubbles. The calculations explore the dependence of the observed bi-modal distribution on the maximum size of the solid Kr precipitates and the effect of this dependence on bubble mobility. The analysis suggests that during the irradiation, whereas the large bubbles move by surface diffusion, the solid Kr precipitates are immobile. The relevance of the Kr-Ni interaction on the solid Kr precipitates size cutoff is discussed. 18 refs., 8 figs., 2 tabs.
- Research Organization:
- Argonne National Lab., IL (USA)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 5028149
- Report Number(s):
- CONF-880613-9; CONF-880613-; ON: DE88009987
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360106* -- Metals & Alloys-- Radiation Effects
BEAMS
BUBBLE GROWTH
BUBBLES
CHARGED PARTICLES
COALESCENCE
CRYSTALS
ELECTRON MICROSCOPY
ELEMENTS
ENERGY RANGE
FILMS
FLUIDS
GASES
ION BEAMS
ION IMPLANTATION
IONS
KEV RANGE
KEV RANGE 100-1000
KRYPTON
KRYPTON IONS
LENNARD-JONES POTENTIAL
METALS
MICROSCOPY
MONOCRYSTALS
NICKEL
NONMETALS
POTENTIALS
PRECIPITATION
RARE GASES
SEPARATION PROCESSES
TRANSITION ELEMENTS
TRANSMISSION ELECTRON MICROSCOPY
360106* -- Metals & Alloys-- Radiation Effects
BEAMS
BUBBLE GROWTH
BUBBLES
CHARGED PARTICLES
COALESCENCE
CRYSTALS
ELECTRON MICROSCOPY
ELEMENTS
ENERGY RANGE
FILMS
FLUIDS
GASES
ION BEAMS
ION IMPLANTATION
IONS
KEV RANGE
KEV RANGE 100-1000
KRYPTON
KRYPTON IONS
LENNARD-JONES POTENTIAL
METALS
MICROSCOPY
MONOCRYSTALS
NICKEL
NONMETALS
POTENTIALS
PRECIPITATION
RARE GASES
SEPARATION PROCESSES
TRANSITION ELEMENTS
TRANSMISSION ELECTRON MICROSCOPY