Analysis of testing the single-fluxon dynamics in a long Josephson junction by a dissipative spot

Journal Article · Sun May 01 04:00:00 EDT 1994 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.49.13024· OSTI ID:5007673

Malomed, B A ^[1]; Ustinov, A V ^[2]

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1. Dipartimento di Fisica, Universita di Salerno, I-84801 Baronissi (Saudi Arabia) (Italy)
2. Institute for Thin Films and Ion Technology, Research Centre (KFA), D-52425 Juelich (Germany)

A change of the [ital I]-[ital V] characteristics of a long Josephson junction, operating in the zero-field single-fluxon regime, under the action of a hot spot'' (e.g., created by a focused electron beam) is calculated analytically by means of the perturbation theory, and also investigated numerically. The change of the average voltage at a given value of the bias current is calculated as a function of the hot spot-position. The overlap Josephson junction geometry is considered in detail, while the inline one is briefly discussed. A good accord between analytical and numerical results is found. The results are relevant for the interpretation of the low-temperature scanning electron microscopy experiments on imaging the fluxon dynamic states in a long Josephson junction.

• OSTI ID: 5007673
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 49:18; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

665411* -- Basic Superconductivity Studies-- (1992-)
665412 -- Superconducting Devices-- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BEAMS
DYNAMICS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON BEAMS
JOSEPHSON JUNCTIONS
JUNCTIONS
LEPTON BEAMS
MECHANICS
PARTICLE BEAMS
PHYSICAL PROPERTIES
SUPERCONDUCTING JUNCTIONS
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE
TEMPERATURE RANGE 0065-0273 K